News

MSSI to Launch New Electron Microscopy Suite

 

The MSSI will host a ceremony to open its new
microscopy suite on 24th September 2009. This new facility has been funded by the Higher Education Authority, Programme for Research in Third-Level Institutions 4 and the Integrated NanoScience Platform for Ireland.
 
Invited speakers Include:
 
Professor Sir John Meurig Thomas, University of Cambridge
Revolutionary Developments from Atomic to Extended Structural Imaging
 
Professor Pierre Stadelmann, Centre Interdépartemental de Microscopie Electrnique of the Ecole Polytechnique Fédérale de Lausanne
The contribution of image simulation to materials characterization  using TEM
 
Dr. Peter Nellist, Department of Materials, University of Oxford
Atomic resolution and three-dimensional imaging and analysis of materials:  The impact of aberration corrected scanning transmission electron microscopy
 
Dr. Neil Campbell, Centre for Materials Discovery, University of Liverpool
Electron Microscopy, an Important Tool in High Throughput Materials Discovery
 
Mr. Keith Dicks, EBSD Specialist, Oxford Instruments
TBA
 
Please RSVP to Emily Barrett by Monday, 7 September 2009
Email: emily.barrett@ul.ie or Tel: 061 234363
Further Details available at http://www.ul.ie/mssi