Overview

The probe station is an invaluable resource for the testing of devices, particularly since it is capable of probing devices while they are still on the wafer or in bars. This means that an assessment of the quality of the samples can be made before any expensive cleaving, electrical contacting and packaging steps are performed. Thus, it provides a means of selecting only the best samples for further experiments.

Main Features:

•    Trinocular stereo microscope
•    1.4 megapixel CCD camera
•    Precision translation stage
•    Laser diode controller

The probe station is part of the PDD's Laser Dynamics Laboratory. Click here for a PDF brochure.

View technology

Location:

PDD, CIT