Overview

Transmission electron microscopy (TEM) is a powerful tool for examining materials at high resolution. In the microscope, electrons are directed through a series of lenses through a thin sample (<200 nm thick). The transmitted electrons then pass through additional lenses to be projected onto a viewing screen or recorded with a digital camera. TEM can provide microstructural details down to an atomic level and can be utilised to examine crystal structures and crystalline defects. Much of the work preformed in MSSI to date has centred on determining structure-property relationships for a wide range of materials, including metals, alloys, semi- and superconductors, ceramics, nanoporous supports and polymers.

The JEOL JEM-2100F is a multipurpose, high resolution, electron microscope with a field emission source. Standard techniques available include bright-/dark field imaging, high resolution lattice imaging and electron diffraction. In addition, there is a STEM attachment, which simultaneously obtains bright field (BF) and high angle annular dark field (HAADF) atomic resolution images. The microscope also includes an SEI/BSE detector enabling topographical data to be collected. The energy dispersive X-ray analyser allows qualitative/quantitative elemental composition analysis even at atomic resolution due to the very small probe size. Digital micrographs and diffraction patterns can be obtained with a state-of-the-art digital camera and software. In addition, computer controlled 3D reconstruction high angle tomography can be achieved.
 

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Location:

MSSI, UL